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https://scholar.dlu.edu.vn/handle/123456789/3310| Title: | Short-drain effect of 5 nm tunnel field-effect transistors | Authors: | Yu-Hsuan Chen Nguyễn, Đăng Chiến Jr-Jie Tsai Yan-Xiang Luo Chun-Hsing Shih |
Issue Date: | 2015 | Place of publication: | USA | Publisher: | IEEE Publishing | Pages: | 57-58 | Conference: | Silicon Nanoelectronics Workshop (SNW) | Abstract: | Unique short-drain effect was reported in extremely scaled tunnel field-effect transistors. This study numerically elucidated the short-drain effect and the difference between the short-channel and short-drain effects. For the short-drain effect, the off-state barriers reduce because of decreased drain lengths, generating ambipolar off-state current and degraded short-channel effect. The shorter channel is, the more pronounced is the short-drain effect. |
URI: | https://scholar.dlu.edu.vn/handle/123456789/3310 | ISBN: | 978-4-8634-8538-9 | Type: | Bài báo đăng trên KYHT quốc tế (có ISBN) |
| Appears in Collections: | Kỷ yếu hội thảo (Khoa Vật lý và Kỹ thuật hạt nhân) |
Files in This Item:
| File | Description | Size | Format | Existing users please Login |
|---|---|---|---|---|
| 11 SNW15 - Short-drain effect of 5 nm tunnel field-effect transistors.pdf | 1.02 MB | Adobe PDF |
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