Please use this identifier to cite or link to this item: https://scholar.dlu.edu.vn/handle/123456789/3310
Title: Short-drain effect of 5 nm tunnel field-effect transistors
Authors: Yu-Hsuan Chen
Nguyễn, Đăng Chiến 
Jr-Jie Tsai
Yan-Xiang Luo
Chun-Hsing Shih
Issue Date: 2015
Place of publication: USA
Publisher: IEEE Publishing
Pages: 57-58
Conference: Silicon Nanoelectronics Workshop (SNW)
Abstract: 
Unique short-drain effect was reported in extremely scaled tunnel field-effect transistors. This study numerically elucidated the short-drain effect and the difference between the short-channel and short-drain effects. For the short-drain effect, the off-state barriers reduce because of decreased drain lengths, generating ambipolar off-state current and degraded short-channel effect. The shorter channel is, the more pronounced is the short-drain effect.
URI: https://scholar.dlu.edu.vn/handle/123456789/3310
ISBN: 978-4-8634-8538-9
Type: Bài báo đăng trên KYHT quốc tế (có ISBN)
Appears in Collections:Kỷ yếu hội thảo (Khoa Vật lý và Kỹ thuật hạt nhân)

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