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	Issue Date	Title	Author(s)	Type
	2011	Impact of edge encroachment on programming and erasing gate current in NAND-type Flash memory	Ji-Ting Liang; Chun-Hsing Shih; Wei Chang; Yan-Xiang Luo; Ming-Kun Huang; Nguyễn, Đăng Chiến ; Wen-Fa Wu; Sau-Mou Wu; Chenhsin Lien; Riichiro Shirota; Chiu-Tsung Huang; Su Lu; Alex Wang	Journal article
	2011	Schottky barrier silicon nanowire SONOS memory with ultralow programming and erasing voltages	Chun-Hsing Shih; Wei Chang; Yan-Xiang Luo; Ji-Ting Liang; Ming-Kun Huang; Nguyễn, Đăng Chiến ; Ruei-Kai Shia; Jr-Jie Tsai; Wen-Fa Wu; Chenhsin Lien	Journal article

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